A Bayesian-like estimator of Cpk

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Title:	A Bayesian-like estimator of Cpk
Authors:	Pearn, W.L.;Chen, K.S.
Date:	1996
Issue Date:	2009-08-20 07:31:51 (UTC+8)
Abstract:	Bissell (1990) proposed an estimator for the process capability index Cpk assuming the knowledge whether the process mean p < m or p 2 m is available, where m is the mid-point between the upper and lower specification limits. Kotz, Pearn and Johnson (1993) showed that for the index Cpk, the natural estimator gives values for the standard deviation smaller than those of Bissell's. In this paper we show that by adding a well-known correction factor to Bissell's estimator, we obtain an unbiased estimator of Cpk whose standard deviation is smaller than those given in Kotz, Pearn and Johnson (1993). In addition, we propose a Bayesian-like estimator which relaxes Bissell's assumption on the process mean. The distribution of the new estimator is shown to be identical to that of Bissell's estimator.
Relation:	Communications in Statistics-Simulation, 25(2), 321-329
Appears in Collections:	[Development of Industrial Engineering and Management] 【工業工程與管理系所】期刊論文

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