New generalization of the process capability index Cpk

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题名:	New generalization of the process capability index Cpk
作者:	Pearn, W.L.;Chen, K.S.
日期:	1998
上传时间:	2009-08-20 07:56:54 (UTC+8)
出版者:	© Taylor & Francis
摘要:	The process capability index Cpk has been widely used in manufacturing industry to provide numerical measures of process potential and performance. As noted by many quality control researchers and practitioners, Cpk is yield-based and is independent of the target T. This fails to account for process center ing with symmetr ic tolerances, and presents an even greater problem with asymmetric tolerances. To overcome the problem, several generalizations of Cpk have been proposed to handle processes with asymmetric tolerances. Unfor tunately, these generalizations understate or overstate the process capability in many cases, so reflect the process potential and performance inaccurately. In this paper, we first introduce a new index C"pk , which is shown to be super ior to the existing generalizations of Cpk . We then investigate the statistical properties of the natural estimator of C"pk , assuming that the process is normally distr ibuted.
關聯:	Journal of applied Statistics, 25(6), 801-810
显示于类别:	[工業工程與管理系(所)] 【工業工程與管理系所】期刊論文

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