A Robust Data Retention Characteristic of Sol-gel Derived Nanocrystal Memory by Hot Hole Trapping

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Title:	A Robust Data Retention Characteristic of Sol-gel Derived Nanocrystal Memory by Hot Hole Trapping
Authors:	游信強
Contributors:	電子工程(學)系
Date:	2010-05
Issue Date:	2013-07-03 14:40:08 (UTC+8)
Publisher:	New York, NY : Institute of Electrical and Electronics Engineers
Relation:	IEEE Electron Device Letters
Appears in Collections:	[Department of Electronic Engineering] 【電子工程系所】期刊論文

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