勤益科大機構典藏:Item 987654321/4163
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 2928/5721 (51%)
Visitors : 1409855      Online Users : 901
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncut.edu.tw/handle/987654321/4163


    Title: Effect of strain relaxation of oxidation-treated SiGe epitaxial thin films and its nanomechanical characteristics
    Authors: 江東源
    Contributors: 機械工程(學)系
    Date: 2010-03
    Issue Date: 2013-07-09 10:04:56 (UTC+8)
    Publisher: [Amsterdam : New York] : North-Holland
    Relation: Applied Surface Science; 256(10)
    Appears in Collections:[Department of Mechanical Engineering] 【機械工程系】期刊論文

    Files in This Item:

    File Description SizeFormat
    江東源245.pdf244KbAdobe PDF1589View/Open


    All items in NCUTIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback