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    請使用永久網址來引用或連結此文件: http://ir.lib.ncut.edu.tw/handle/987654321/5821


    題名: The TiO2 Refraction Film for CsI Scintillator
    作者: C. C. Chen, C. W. Hun, C. J. Wang, C. Y. Chen, J. S. Lin, K. J. Huang
    貢獻者: 圖書館
    關鍵詞: Cesium iodide
    AAO
    TiO2,
    Refraction
    X-ray.
    日期: 2015
    上傳時間: 2016-10-14 09:29:26 (UTC+8)
    摘要: Cesium iodide (CsI) melt was injected into anodic aluminum oxide (AAO) template and was solidified to CsI column. The controllable AAO channel size (10~500 nm) can makes CsI column size from 10 to 500 nm in diameter. In order to have a shorter light irradiate from each singe CsI column top to bottom the AAO template was coated a TiO2 nano-film. The TiO2 film acts a refraction film and makes X-ray has a shorter irradiation path in the CsI crystal making a stronger the photo-electron signal. When the incidence light irradiate from air (R=1.0) to CsI’s first surface (R=1.84) the first refraction happen, the first refraction continue into TiO2 film (R=2.88) and produces the low angle of the second refraction. Then the second refraction continue into AAO wall (R=1.78) and produces the third refraction after refractions between CsI and AAO wall (R=1.78) produce the fourth refraction. The incidence light through TiO2 filmand the first surface of CsI then arrive to the second surface of CsI. Therefore, the TiO2 film can has shorter refraction path of incidence light and increase the photo-electron conversion efficiency.
    關聯: International Science Index
    顯示於類別:[機械工程系(所)] 【機械工程系】期刊論文

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