Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator

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题名:	Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator
作者:	王靖欣
贡献者:	專案管理研究所碩士班
日期:	2013-07
上传时间:	2017-10-02 10:39:52 (UTC+8)
摘要:	Quartz crystal is an electronic component made of “quartz” element. In the beginning, it was used in timepieces as the basis of reference for time keeping. Because the crystal has excellent features of stability in temperature change and low wearing, crystal component-based piezoelectric oscillators like crystal, crystal oscillator, crystal filter and optical device have become indispensible passive components for communication in the telecom industry. Furthermore, Of these processes, the wiring process is one of the crucial processes throughout the packaging, where if the quality of the wire for packaging the product is poor, it is very likely to cause poor contact between signal connectors and gold wire on IC or broken gold wires in the course of product transfer, sealing and baking as well as in the course of the product being bonded to the substrate, resulting in the whole IC-packaged product unable to function normally. This article, thus, will develop a model of assessing and testing process capabilities with process capability index, Cpl, specifically for the larger-the-better quality characteristic of wire process. The article will also provide the assessment procedure, whereby the industry can effectively evaluate whether the process capabilities of their products meet the benchmarks they are supposed to.
關聯:	Lecture Notes in Computer Science
显示于类别:	[專案管理研究所] 期刊論文

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