勤益科大機構典藏:Item 987654321/6976
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    Please use this identifier to cite or link to this item: http://ir.lib.ncut.edu.tw/handle/987654321/6976


    Title: Thermal reliability of thin SiGe epilayers
    Authors: 江東源
    Contributors: 機械工程(學)系
    Date: 2012-04
    Issue Date: 2017-12-19 09:14:08 (UTC+8)
    Relation: Applied Surface Science
    Appears in Collections:[Department of Mechanical Engineering] 【機械工程系】期刊論文

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