Singular value decomposition combined with wavelet transform for LCD defect detection

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Title:	Singular value decomposition combined with wavelet transform for LCD defect detection
Authors:	陳文淵
Contributors:	電子工程(學)系
Date:	2012-03
Issue Date:	2018-01-07 14:38:46 (UTC+8)
Abstract:	Singular value decomposition is used to obtain the mean value of the first and second singular value ratios of normal and defect LCD images. Then the third and fourth singular values matched with the standard deviation of the first two singular value ratios are used to divide the defect images into two categories: coarse and fine. Finally, 2D discrete wavelet coefficient filtering combined with region growing is adopted to extract defect regions. © 2012 The Institution of Engineering and Technology. (9 refs)
Relation:	ELECTRONICS LETTERS
Appears in Collections:	[Department of Electronic Engineering] 【電子工程系所】期刊論文

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