勤益科大機構典藏:Item 987654321/7107
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 2928/5721 (51%)
造访人次 : 374156      在线人数 : 742
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://ir.lib.ncut.edu.tw/handle/987654321/7107


    题名: Dice Image Recognition Scheme Using Pattern Comparison and Affine Transform Techniques
    作者: 陳文淵
    贡献者: 電子工程(學)系
    日期: 2012-10
    上传时间: 2018-01-07 14:40:07 (UTC+8)
    摘要: In dice recognition, there are several situations which may cause dice image identification problems including that the shape of the dice is round, or the dice may touch each other. Especially in camera zooming in or zooming out, the pip sizes become irregular. In this paper, we adopt an affine transform technique and a pattern comparison method to develop an intelligent dice pattern match ratio to achieve accurate dice recognition. A normalization technique solves image zooming in and zooming out problems and an affine transformation rotates the shape in various angular positions for object pattern comparison so that it greatly improves the dice image recognition successful. After over 200 test images that include different shapes, styles, sizes and colors used in simulations, this scheme is proven to achieve 100% dice image identification. (14 refs)
    關聯: Advances in Information Service Sciences (AISS)
    显示于类别:[電子工程系(所)] 【電子工程系所】期刊論文

    文件中的档案:

    没有与此文件相关的档案.



    在NCUTIR中所有的数据项都受到原著作权保护.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 回馈