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    請使用永久網址來引用或連結此文件: http://ir.lib.ncut.edu.tw/handle/987654321/3518


    題名: Totally Self-Checking Carry-Select Adder Design Based on Two-Rail Code
    作者: Shao-Hui Shieh
    Ming-En Lee
    貢獻者: 勤益科技大學
    關鍵詞: Totally self-checking
    two-rail code
    carry select adder
    checker
    on-line test
    日期: 2010-06
    上傳時間: 2010-09-16 17:02:30 (UTC+8)
    摘要: In this paper, the totally self-checking (TSC) carry-select adder (CSA) design is proposed. The capability of TSC can detect all single stuck-at faults on-line in normal operation mode. The proposed CSA has not only self-checking capability but also educed
    transistor count. The design is based on TSMC
    0.18um process technology, and a real chip is
    implemented. The transistor count of roposed totally self-checking CSA design is less than conventional CSA, and even reduced 34.85% compared with [4] for thirty-two bits design. The reduced ratio of transistor-count is proportional to the bit count of
    totally self-checking CSA to be designed. Our design has other advantages such as high extensibility, non-tree detector structure, and thus having reasonable propagation delay time and can keeping well normal operation in the high-bit design.
    關聯: 第五屆智慧生活科技研討會論文集(上)
    顯示於類別:[資訊工程系(所)] 第五屆智慧生活科技研討會

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