Singular value decomposition combined with wavelet transform for LCD defect detection

勤益科大機構典藏 > 電資學院 > 電子工程系(所) > 【電子工程系所】期刊論文 > Item 987654321/7106

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題名:	Singular value decomposition combined with wavelet transform for LCD defect detection
作者:	陳文淵
貢獻者:	電子工程(學)系
日期:	2012-03
上傳時間:	2018-01-07 14:38:46 (UTC+8)
摘要:	Singular value decomposition is used to obtain the mean value of the first and second singular value ratios of normal and defect LCD images. Then the third and fourth singular values matched with the standard deviation of the first two singular value ratios are used to divide the defect images into two categories: coarse and fine. Finally, 2D discrete wavelet coefficient filtering combined with region growing is adopted to extract defect regions. © 2012 The Institution of Engineering and Technology. (9 refs)
關聯:	ELECTRONICS LETTERS
顯示於類別:	[電子工程系(所)] 【電子工程系所】期刊論文

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